The new MAP-200 based Swept Wavelength Test System (mSWS) series represents the continued evolution of VIAVI’s industry standard solution for measuring insertion loss (IL), polarization dependent loss (PDL), return loss (RL) and directivity of DWDM devices.

It provides the optical performance required for high wavelength resolution testing in both research and development (R&D) and production environments of next-gen DWDM devices.

Currently used at more than 100 customer sites, with over 9000 detector channels deployed, the SWS test platform validates optical performance for the latest in optical components and modules including: ROADMs, Wavelength Switches, Tunable Filters and Circuit Packs. The SWS system consists of a tunable laser source, a source optics module (SOM), a control module, a receiver chassis, one or more detector modules and application software